Femtosecond pulsed laser deposition of a boron thin film aiming at the development of a low-cost neutron detector
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2018
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HIGH-POWER LASER MATERIALS PROCESSING: APPLICATIONS, DIAGNOSTICS, AND SYSTEMS, 7th
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Boron thin films were produced using femtosecond pulsed laser deposition aiming at the development of a neutron
detector. As neutrons have no charge, in order to detect this particle converter materials are applied, promoting nuclear
reactions that result in the emission of charged particles, allowing the neutrons presence to be indirectly inferred. Among
the possible conversion materials, 10B has a considerable cross section for thermal neutrons and accessible cost.
Furthermore, the nuclear reaction produces easily detectable alpha particles, making it a rational option to develop a low
cost and portable neutron detector. The boron ablation threshold fluence has been measured by the Diagonal Scan (Dscan)
technique that resulted in the minimum laser energy value of 17.7 (6) μJ and fluence of 5.63(19) J/cm2. Boron
deposition was performed varying the pulse energy and deposition duration. The growth rate, morphological and
physical aspects of the boron pulsed laser deposition were characterized by a Scanning Electron Microscope and an
optical profilometer. The films surfaces have a flaky aspect with eventual droplets which had decayed overtime to a
more smooth surface. The studied parameters allowed producing a boron coating with the optimal thickness in order to
minimize self-absorption effect in the film, thus increasing efficiency.
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COSTA, PRISCILA; RAELE, MARCUS P.; SAMAD, RICARDO E.; MACHADO, NOE G.P.; VIEIRA JUNIOR, NILSON D.; GENEZINI, FREDERICO A. Femtosecond pulsed laser deposition of a boron thin film aiming at the development of a low-cost neutron detector. In: KAIERLE, STEFAN (ed.); HEINEMANN, STEFAN W. (ed.). In: HIGH-POWER LASER MATERIALS PROCESSING: APPLICATIONS, DIAGNOSTICS, AND SYSTEMS, 7th, January 27 - February 01, 2018, San Francisco, California, USA. Proceedings... Bellingham, WA, USA: Society of Photo-optical Instrumentation Engineers, 2018. p. 105250J-1 - 105250J-7. (SPIE Proceedings Series, 10525). DOI: 10.1117/12.2285896. Disponível em: http://repositorio.ipen.br/handle/123456789/29021. Acesso em: 19 Apr 2024.
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