Application of bias correction methods to improve U3Si2 sample preparation for quantitative analysis by WDXRF
Carregando...
Data
2019
Data de publicação:
Orientador
Título da Revista
ISSN da Revista
Título do Volume
É parte de
É parte de
É parte de
Brazilian Journal of Radiation Sciences
Exportar
Resumo
The determination of silicon (Si), total uranium (U) and impurities in uranium-silicide (U3Si2) samples by wavelength dispersion X-ray fluorescence technique (WDXRF) has been already validated and is currently implemented at IPEN’s X-Ray Fluorescence Laboratory (IPEN-CNEN/SP) in São Paulo, Brazil. Sample preparation requires the use of approx-imately 3 g of H3BO3 as sample holder and 1.8 g of U3Si2. However, because boron is a neutron absorber, this proce-dure precludes the recovery of U3Si2 from the samples, preventing its use as nuclear fuel. Consequently, a significant amount of uranium is wasted in this process. An estimated average of 15 samples per month is expected to be analyzed by WDXRF, resulting in approx. 320 g of U3Si2 that wouldn’t return to the nuclear fuel cycle. The purpose of this paper is to present a new preparation method, replacing H3BO3 by cellulose acetate {[C6H7O2(OH)3-m(OOCCH3)m], m = 0~3}, thus enabling the recovery of the boron-free U3Si2 from the samples. The results demonstrate that the suggested sample preparation approach is statistically satisfactory, allowing the optimization of the procedure.
Como referenciar
SCAPIN, M.A.; GUILHEN, S.N.; AZEVEDO, L.C.; COTRIN, M.E.B.; PIRES, M.A.F. Application of bias correction methods to improve U3Si2 sample preparation for quantitative analysis by WDXRF. Brazilian Journal of Radiation Sciences, v. 7, n. 2A, p. 1-9, 2019. DOI: 10.15392/bjrs.v7i2A.582. Disponível em: http://repositorio.ipen.br/handle/123456789/29954. Acesso em: 19 Apr 2024.
Esta referência é gerada automaticamente de acordo com as normas do estilo IPEN/SP (ABNT NBR 6023) e recomenda-se uma verificação final e ajustes caso necessário.