Thickness estimation of TiO2-based nanotubes using X-ray diffraction techniques
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2020
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Materials Science Forum
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TiO2-based nanotubes are a very promising material with many applications in solar
cells, biomedical devices, gas sensors, hydrogen generation, supercapacitors, and lithium batteries,
among others. Nanotube thickness is a very important property since it is related to electronic and
surface mechanics. In this sense, transmission electron microscopy (TEM) can be used. However, it
can be difficult to acquire a good TEM image because the transversal section of the nanotubes
needs to be visible. In this work, TiO2-based nanotubes obtained via hydrothermal synthesis were
studied using X-ray line profile analysis. Scherrer and Single-Line methods provided consistent
results for the thickness of the nanotubes (≃ 5 nm) when compared with TEM. Additionally,
Single-Line method was also applied to estimate the microstrain. The advantage of using XRD is
given by the fact that it is a quick and statistically significant analysis when compared with TEM.
The results show that XRD can be used as a rapid and reliable alternative for the thickness
estimation of nanotubes.
Como referenciar
FARIA, MARCELA E.M.; LEITE, MARINA M.; ICHIKAWA, RODRIGO U.; VICHI, FLAVIO M.; TURRILLAS, X.; MARTINEZ, L.G. Thickness estimation of TiO2-based nanotubes using X-ray diffraction techniques. Materials Science Forum, v. 1012, p. 179-184, 2020. DOI: 10.4028/www.scientific.net/MSF.1012.179. Disponível em: http://200.136.52.105/handle/123456789/31644. Acesso em: 18 Apr 2024.
Esta referência é gerada automaticamente de acordo com as normas do estilo IPEN/SP (ABNT NBR 6023) e recomenda-se uma verificação final e ajustes caso necessário.