MAZZOCCHI, V.L.BALDOCHI, S.L.PARENTE, C.B.R.PAIVA SANTOS, C.O.SANTILLI, C.V.2014-11-192014-11-192015-04-012014-11-192014-11-192015-04-01MAZZOCCHI, V.L.; BALDOCHI, S.L.; PARENTE, C.B.R.; PAIVA SANTOS, C.O.; SANTILLI, C.V. X-ray Rietveld analysis of pure and doped LiSAFsub(6) crystals at different temperatures. In: CONGRESSO BRASILEIRO DE ENGENHARIA E CIENCIA DOS MATERIAIS, 15., 9-13 nov, 2002, Natal, RN. <b>Resumos...</b> DisponÃvel em: http://repositorio.ipen.br/handle/123456789/20965.http://repositorio.ipen.br/handle/123456789/20965openAccesslaser materialslithium fluoridesstrontium fluoridesaluminium fluoridesdoped materialschromiumceriumsodiumcrystal growthczochralski methodx-ray diffractiontemperature dependenceX-ray Rietveld analysis of pure and doped LiSAFsub(6) crystals at different temperaturesResumo de eventos cientÃficos