PUGLIESI, R.ANDRADE, M.L.G.DIAS, M.S.SIQUEIRA, P.T.D.PEREIRA, M.A.S.2015-12-302015-12-302015PUGLIESI, R.; ANDRADE, M.L.G.; DIAS, M.S.; SIQUEIRA, P.T.D.; PEREIRA, M.A.S. Study of pixel damages in CCD cameras irradiated at the neutron tomography facility of IPEN-CNEN/SP. <b>Nuclear Instruments and Methods in Physics Research</b>, v. 804, p. 59-63, 2015. Section A. DisponÃvel em: http://repositorio.ipen.br/handle/123456789/25439.0168-9002http://repositorio.ipen.br/handle/123456789/2543959-63openAccesscamerassensorscharge-coupled devicestomographyneutron beamsdamageformation damagenuclear facilitiesphysical radiation effectsStudy of pixel damages in CCD cameras irradiated at the neutron tomography facility of IPEN-CNEN/SPArtigo de periódico804Section Ahttps://orcid.org/0000-0003-2478-575742.77