SILVA JÚNIOR, IREMAR A.SIQUEIRA, PAULO de T.D.NASCIMENTO, EDUARDO doYORIYAZ, HELIOSORDI, GIAN-MARIA A.A.VIVOLO, VITORPOTIENS, MARIA da P.A.2020-07-212020-07-212020SILVA JÚNIOR, IREMAR A.; SIQUEIRA, PAULO de T.D.; NASCIMENTO, EDUARDO do; YORIYAZ, HELIO; SORDI, GIAN-MARIA A.A.; VIVOLO, VITOR; POTIENS, MARIA da P.A. Correction factors for non-uniform large-area reference sources. <b>Applied Radiation and Isotopes</b>, v. 160, p. 1-6, 2020. DOI: <a href="https://dx.doi.org/10.1016/j.apradiso.2020.109082">10.1016/j.apradiso.2020.109082</a>. Disponível em: http://repositorio.ipen.br/handle/123456789/31343.0969-8043http://repositorio.ipen.br/handle/123456789/31343Based on uniformity measurements of large-area reference sources used in calibration procedures of surface contamination monitors, an investigation was carried out to obtain a method that estimates the bias originated from surface source intensity distribution deviation from the ideal uniform distribution and corrects it. It relies on correcting the estimated instrument efficiency by applying correction factors driven from the uniformity distribution profiles of the sources used in calibration procedure. Simulations of the monitor calibration procedure are run for 2 distinct surface source distributions: the real and the ideally uniform distributions. Correction factors are driven from counting rate estimates obtained from each source representation. In order to evaluate adequacy of this proposition it was validated against a method proposed by the NPL in the Good Practices Guide No.14.1-6openAccesscorrectionsradiation sourcescalibrationmonte carlo methodnumerical datasurface contamination monitorsmeasuring methodsArtigo de periódico16010.1016/j.apradiso.2020.1090820000-0002-4049-67200000-0003-4023-236Xhttps://orcid.org/0000-0003-4023-236X0000-0003-2281-57560000-0001-9475-8266https://orcid.org/0000-0002-4049-672034.9644.00