SARKIS, J.E.S.PESTANA, R.C.B.MARIN, R.C.CARVALHO, E.F.U.2018-03-202018-03-20SARKIS, J.E.S.; PESTANA, R.C.B.; MARIN, R.C.; CARVALHO, E.F.U. The use of SEM-EDX for the identification of uranium compounds in swipe samples for nuclear safeguards. In: 60 YEARS OF IEA-R1: INTERNATIONAL WORKSHOP ON UTILIZATION OF RESEARCH REACTORS, November 28 - December 01, 2017, São Paulo, SP. <b>Abstract...</b> São Paulo, SP: Instituto de Pesquisas Energéticas e Nucleares, 2017. p. 73-73. Disponível em: http://repositorio.ipen.br/handle/123456789/28774.http://repositorio.ipen.br/handle/123456789/28774Environmental swipe sampling for safeguards purposes has been used by International Atomic Energy Agency since 1996 and is a powerful tool to detect undeclared materials and activities in States under safeguards agreements. The Secondary Electron Microscope with Energy-Dispersive X-Ray analyzing system (SEM-EDX) can be particularly useful in the initial identification of uranium in swipe samples and might be appropriate to identify and characterize uranium particles This work describes the use of SEM-EDX, as an initial screening technique, in real-life swipe samples for identifying and characterizing uranium particles. The swipe samples were collected in a conversion plant at the Nuclear and Energy Research Institute – IPEN/CNEN, São Paulo, Brazil73-73openAccessResumo de eventos científicoshttps://orcid.org/0000-0001-8542-3827https://orcid.org/0000-0002-6745-8185