COURROL, L.C.GOMES, L.RANIERI, I.M.2014-11-172014-11-182015-04-022014-11-172014-11-182015-04-02COURROL, L.C.; GOMES, L.; RANIERI, I.M. Evaluation of microscopic parameters for ETU process in diode-pumped Nd:YLF. In: 8th EUROPHYSICAL CONFERENCE ON DEFECTS IN INSULATING MATERIALS, July 6-11, 1998, Keele, Staffs, UK. <b>Proceedings...</b> DisponÃvel em: http://repositorio.ipen.br/handle/123456789/15639.http://repositorio.ipen.br/handle/123456789/15639openAccesslasersneodymium laserslithium fluoridesyttrium fluoridesdiode-pumped solid state laserslaser spectroscopyexcitationEvaluation of microscopic parameters for ETU process in diode-pumped Nd:YLFTexto completo de evento