ARATA, A.PRETTO, L.R. deUSSUI, V.LIMA, N.B.FREITAS, A.Z.MACHADO, J.P.B.TANGO, R.N.SOUZA, G.M.D. deLAZAR, D.R.R.2017-03-162017-03-162016ARATA, A.; PRETTO, L.R. de; USSUI, V.; LIMA, N.B.; FREITAS, A.Z.; MACHADO, J.P.B.; TANGO, R.N.; SOUZA, G.M.D. de; LAZAR, D.R.R. Y-TZP low temperature degradation: a sigmoidal or a linear behavior?. <b>Dental Materials</b>, v. 32, p. e99-e99, 2016. 1. DOI: <a href="https://dx.doi.org/10.1016/j.dental.2016.08.208">10.1016/j.dental.2016.08.208</a>. DisponÃvel em: http://repositorio.ipen.br/handle/123456789/27195.0109-5641http://repositorio.ipen.br/handle/123456789/27195e99-e99openAccessyttrium oxideszirconium oxidesaginghydrothermal systemstemperature dependencex-ray diffractionY-TZP low temperature degradation: a sigmoidal or a linear behavior?Resumos em periódicos32110.1016/j.dental.2016.08.208https://orcid.org/0000-0001-7384-304Xhttps://orcid.org/0000-0002-5018-9126https://orcid.org/0000-0002-6444-9224