SILVEIRA, L.G.D.DIAS, G.S.COTICA, L.F.EIRAS, J.A.GARCIA, D.SAMPAIO, J.A.YOKAICHIYA, F.SANTOS, I.A.2014-08-132014-08-132013SILVEIRA, L.G.D.; DIAS, G.S.; COTICA, L.F.; EIRAS, J.A.; GARCIA, D.; SAMPAIO, J.A.; YOKAICHIYA, F.; SANTOS, I.A. Charge carriers and small-polaron migration as the origin of intrinsic dielectric anomalies in multiferroic TbMnOsub(3) polycrystals. <b>Journal of Physics: Condensed Matter</b>, v. 25, n. 47, p. 875401-1 - 875401-8, 2013. DisponÃvel em: http://repositorio.ipen.br/handle/123456789/8926.0953-8984http://repositorio.ipen.br/handle/123456789/8926875401-1 - 875401-8openAccessferroelectric materialsferromagnetic materialsterbium oxidesmanganese oxidestemperature dependencedielectric propertiespolycrystalsmigrationpolaronsCharge carriers and small-polaron migration as the origin of intrinsic dielectric anomalies in multiferroic TbMnOsub(3) polycrystalsArtigo de periódico4725