SANTOS, T.C. dosGONCALVES, J.A.C.PASCOALINO, K.C.S.HARKONEN, J.BUENO, C.C.2014-11-192014-11-192015-04-012014-11-192014-11-192015-04-01SANTOS, T.C. dos; GONCALVES, J.A.C.; PASCOALINO, K.C.S.; HARKONEN, J.; BUENO, C.C. Evaluation of radiation-hard magnetic Czochralski (MCz) silicon diodes in electron processing dosimetry. In: INSTERNATIONAL CONFERENCE ON DOSIMETRY AND ITS APPLICATIONS, 1st, June 23-28, 2013, Praga, Republica Checa. <b>Abstract...</b> Disponível em: http://repositorio.ipen.br/handle/123456789/20277.http://repositorio.ipen.br/handle/123456789/20277openAccessczochralski methodsilicon diodesdosimetryabsorbed radiation dosesdose-response relationshipsradiation injuriesResumo de eventos científicoshttps://orcid.org/0000-0001-7881-7254https://orcid.org/0000-0002-8940-9544