SANTOS, ROBINSON A. dosCOSTA, FABIO E. daGENNARI, ROSELI F.MARTINS, JOAO F.T.MARCONDES, RENATA M.MESQUITA, CARLOS H. deHAMADA, MARGARIDA M.2014-11-172014-11-182015-04-022014-11-172014-11-182015-04-02SANTOS, ROBINSON A. dos; COSTA, FABIO E. da; GENNARI, ROSELI F.; MARTINS, JOAO F.T.; MARCONDES, RENATA M.; MESQUITA, CARLOS H. de; HAMADA, MARGARIDA M. Multielementar segregation analysis of the thallium bromide impurities purified by repeated bridgman technique. In: INTERNATIONAL NUCLEAR ATLANTIC CONFERENCE; MEETING ON NUCLEAR APPLICATIONS, 10th; MEETING ON REACTOR PHYSICS AND THERMAL HYDRAULICS, 17th; MEETING ON NUCLEAR INDUSTRY, 2nd, October 24-28, 2011, Belo Horizonte, MG. <b>Proceedings...</b> DisponÃvel em: http://repositorio.ipen.br/handle/123456789/14149.http://repositorio.ipen.br/handle/123456789/14149openAccessthalium bromidesimpuritiessemiconductor detectorscrystal growthcompartmentsbridgman methodMultielementar segregation analysis of the thallium bromide impurities purified by repeated bridgman techniqueTexto completo de evento