BRESSIANI, A.H.A.ESCOTE, M.T.BRESSIANI, J.C.2014-11-192014-11-192015-04-012014-11-192014-11-192015-04-01BRESSIANI, A.H.A.; ESCOTE, M.T.; BRESSIANI, J.C. Microestrutura de beta-SiAlOn com adicao de concentrado de itria. In: 2rd INTERAMERICAN CONFERENCE ON ELECTRON MICROSCOPY; 15th BRAZILIAN SOCIETY FOR ELECTRON MICROSCOPY, September 2-6, 1995, Caxambu, MG. <b>Resumo...</b> p. 65. Disponível em: http://repositorio.ipen.br/handle/123456789/21985.http://repositorio.ipen.br/handle/123456789/2198565openAccessaluminium oxidessilicon nitridesyttrium oxidesmicrostructurex-ray diffractionResumo de eventos científicos