Rietveld analysis of Besub(3)Alsub(2)(SiOsub(3))sub(6) employing high-resolution neutron powder diffraction patterns

PARENTE, C.B.R.MAZZOCCHI, V.L.MESTNIK FILHO, J.MASCARENHAS, Y.P.WATANABE, S.2014-11-192014-11-192015-04-012014-11-192014-11-192015-04-01PARENTE, C.B.R.; MAZZOCCHI, V.L.; MESTNIK FILHO, J.; MASCARENHAS, Y.P.; WATANABE, S. Rietveld analysis of Besub(3)Alsub(2)(SiOsub(3))sub(6) employing high-resolution neutron powder diffraction patterns. In: ENCONTRO NACIONAL DE FISICA DA MATERIA CONDENSADA, 34., 5-10 de junho, 2011, Foz do Iguaçu, PR. <b>Resumos...</b> Disponível em: http://repositorio.ipen.br/handle/123456789/22480.http://repositorio.ipen.br/handle/123456789/22480openAccessberylliumaluminiumsilicon oxidesneutron diffractioncrystallographycrystal structureRietveld analysis of Besub(3)Alsub(2)(SiOsub(3))sub(6) employing high-resolution neutron powder diffraction patternsResumo de eventos científicoshttps://orcid.org/0000-0001-5369-4083