HABENICHT, S.ATTILI, R.N.METZNER, H.LUPASCU, D.UHRMACHER, M.ZIEGELER, L.LIEB, K.P.2014-11-172014-11-182015-04-022014-11-172014-11-182015-04-02HABENICHT, S.; ATTILI, R.N.; METZNER, H.; LUPASCU, D.; UHRMACHER, M.; ZIEGELER, L.; LIEB, K.P. Submicroscopy characterization of indium-tin oxide films by PAC. In: 10th INTERNATIONAL CONFERENCE ON TERNARY AND MULTITERNARY COMPOUNDS, September 19-22, 1995, Sttutgard, Germany. DisponÃvel em: http://repositorio.ipen.br/handle/123456789/12673.http://repositorio.ipen.br/handle/123456789/12673openAccesstin oxidesindium oxidesfilmsperturbed angular correlationmicroscopySubmicroscopy characterization of indium-tin oxide films by PACTexto completo de evento