MOREIRA, DENISE S.KOSKINAS, MARINA F.YAMAZAKI, IONE M.DIAS, MAURO S.2014-11-172014-11-182015-04-012014-11-172014-11-182015-04-01MOREIRA, DENISE S.; KOSKINAS, MARINA F.; YAMAZAKI, IONE M.; DIAS, MAURO S. Determination of sup(51)Cr and sup(241)Am X-ray and gamma-ray emission probabilities per decay. In: INTERNATIONAL TOPICAL MEETING ON INDUSTRIAL RADIATION AND RADIOISOTOPE MEASUREMENT APPLICATION, 7th, June 22-27, 2008, Praga, Republica Tcheca. <b>Proceedings...</b> DisponÃvel em: http://repositorio.ipen.br/handle/123456789/17967.http://repositorio.ipen.br/handle/123456789/17967openAccesschromium 51americium 241x radiationgamma radiationdecayprobabilitysemiconductor detectorsDetermination of sup(51)Cr and sup(241)Am X-ray and gamma-ray emission probabilities per decayTexto completo de eventohttps://orcid.org/0000-0003-2478-5757https://orcid.org/0000-0001-8407-9833