ICHIKAWA, R.U.MARTINEZ, L.G.IMAKUMA, K.LINHARES, H.M.S.M.D.RANIERI, I.M.TURRILLAS, X.2015-06-112015-06-11ICHIKAWA, R.U.; MARTINEZ, L.G.; IMAKUMA, K.; LINHARES, H.M.S.M.D.; RANIERI, I.M.; TURRILLAS, X. Size-strain analysis in RE-doped KY3F10 fluorides using X-ray line profile analysis. In: WORKSHOP OF APPLIED CRYSTALLOGRAPHY TO MATERIALS SCIENCE AND ENGINEERING, 4th, May 23-25, 2014, Vitoria, ES. <b>Anais...</b> DisponÃvel em: http://repositorio.ipen.br/handle/123456789/23729.http://repositorio.ipen.br/handle/123456789/23729openAccessnanostructuresrare earthsdoped materialsytterbium fluoridesstrainsx-ray diffractionSize-strain analysis in RE-doped KY3F10 fluorides using X-ray line profile analysisTexto completo de eventohttps://orcid.org/0000-0001-7707-7821