ROCHA, F.D.G.CALDAS, L.V.E.MAURICIO, C.L.P.MAURICIO, M.H.P.2014-11-172014-11-182015-04-022014-11-172014-11-182015-04-02ROCHA, F.D.G.; CALDAS, L.V.E.; MAURICIO, C.L.P.; MAURICIO, M.H.P. Dosimetric characterization of LiF thin films for soft X-rays using the TSEE technique. In: 4th MEETING ON NUCLEAR APPLICATIONS, ENCONTRO NACIONAL DE APLICACOES NUCLEARES, August 18-22, 1997, Pocos de Caldas, MG. p. 143-145. DisponÃvel em: http://repositorio.ipen.br/handle/123456789/12105.http://repositorio.ipen.br/handle/123456789/12105143-145openAccessthin filmslithium fluoridesaluminiumstainless steelssoft x radiationexoelectronsx-ray dosimetryglow curvecalibrationenergy dependenceDosimetric characterization of LiF thin films for soft X-rays using the TSEE techniqueTexto completo de eventohttps://orcid.org/0000-0002-7362-2455