ZEZELL, D.M.TANJI, E.Y.HAYPEK, P.EDUARDO, C.P.2014-11-192014-11-192015-04-012014-11-192014-11-192015-04-01ZEZELL, D.M.; TANJI, E.Y.; HAYPEK, P.; EDUARDO, C.P. Scanning electron microscopy and RX fluorescence of class I cavity preparation with Er:YAG laser. In: 6. INTERN. JAHRESKOGRESS DER DEUTSCHE GESELLSCHAFT FUER LASER-ZAHNHEILKUNDE E.V, Januar 31 - Februar 2, 1997, Frankfurt, DE. <b>Abstract...</b> p. 8. DisponÃvel em: http://repositorio.ipen.br/handle/123456789/22647.http://repositorio.ipen.br/handle/123456789/226478openAccessteethlaserserbiumx-ray fluorescence analysisscanning electron microscopydentinsurface treatmentsmorphological changesScanning electron microscopy and RX fluorescence of class I cavity preparation with Er:YAG laserResumo de eventos cientÃficoshttps://orcid.org/0000-0001-7404-9606