COSTA, PRISCILARAELE, MARCUS P.YORIYAZ, HELIOSIQUEIRA, PAULO de T.D.ZAHN, GUILHERME S.GENEZINI, FREDERICO A.2015-11-092015-11-09COSTA, PRISCILA; RAELE, MARCUS P.; YORIYAZ, HELIO; SIQUEIRA, PAULO de T.D.; ZAHN, GUILHERME S.; GENEZINI, FREDERICO A. Boron film thickness determination to develop a low cost neutron using Monte Carlo Method. In: INTERNATIONAL NUCLEAR ATLANTIC CONFERENCE; MEETING ON NUCLEAR APPLICATIONS, 12th; MEETING ON REACTOR PHYSICS AND THERMAL HYDRAULICS, 19th; MEETING ON NUCLEAR INDUSTRY, 4th, October 4-9, 2015, São Paulo, SP. <b>Proceedings...</b> Disponível em: http://repositorio.ipen.br/handle/123456789/25140.http://repositorio.ipen.br/handle/123456789/25140openAccessboronthin filmsmonte carlo methodneutron fluxneutron detectionalpha particlesthermal neutronscharged particlescomputerized simulationphotodiodessiliconthicknessBoron film thickness determination to develop a low cost neutron using Monte Carlo MethodTexto completo de eventohttps://orcid.org/0000-0003-4023-236Xhttps://orcid.org/0000-0002-6318-6805https://orcid.org/0000-0003-3237-8588https://orcid.org/0000-0002-6461-6766