RABELO, THAIS F.ZAMATARO, CLAUDIA B.KUCHAR, NIELSEN G.ZANINI, NATHALIAJUVINO, AMANDA C.DEL-VALLE, MATHEUSCASTRO, PEDRO A.A.SANTOS, MOISES O.ZEZELL, DENISE M.2020-08-182020-08-182019RABELO, THAIS F.; ZAMATARO, CLAUDIA B.; KUCHAR, NIELSEN G.; ZANINI, NATHALIA; JUVINO, AMANDA C.; DEL-VALLE, MATHEUS; CASTRO, PEDRO A.A.; SANTOS, MOISES O.; ZEZELL, DENISE M. Human dental enamel evaluation after radiotherapy simulation and laminates debonding with Er,Cr:YSGG using SEM and EDS. <b>Journal of Oral Diagnosis</b>, v. 4, p. 1-5, 2019. DOI: <a href="https://dx.doi.org/10.5935/2525-5711.20190022">10.5935/2525-5711.20190022</a>. Disponível em: http://repositorio.ipen.br/handle/123456789/31381.2525-5711http://repositorio.ipen.br/handle/123456789/31381The pursuit of perfection makes younger people undergo aesthetic procedures without formal indication. However, young patients may be susceptible to a disease such as head and neck cancer which treatment can compromise the adhesion of these indirect mate-rials. Here, we present an analyze, of the gamma radiation effects on crystallographic morphology of human dental enamel after laminate veneer debonding with Er,Cr:YSGG laser. Thus, human dental enamel samples were prepared and randomized into 2 groups (n=10): Laser Irradiation (L) and Gamma + Laser Irradiation (GL) group. Scanning elec-tron microscopy (SEM) and energy dispersive X-ray spectroscopy (EDS) were performed before bonding and after debonding using Er,Cr:YSGG. Only Gamma + Laser Irradia-tion group received a cumulative dose of 70 Gy gamma radiation used in head and neck cancer radiotherapy. SEM images showed that both GL and L groups presented altered morphology. EDS showed an decrease in Ca and P intensities after laser debonding of laminates veneers in both group. Therefore, a proper laser facet removal protocol should be established for healthy patients and patients who have been exposed to radiotherapy for head and neck cancer.1-5openAccessteethdentistryenamelsradiotherapylasersgamma radiationneckheadneoplasmsscanning electron microscopyx-ray emission spectroscopyArtigo de periódico410.5935/2525-5711.201900220000-0001-7404-9606https://orcid.org/0000-0001-7404-9606Sem PercentilSem Percentil CiteScore