PASCOALINO, K.C.S.SANTOS, T.C.GONCALVES, J.A.C.HARKONEN, J.BUENO, C.C.2014-11-192014-11-192015-04-012014-11-192014-11-192015-04-01PASCOALINO, K.C.S.; SANTOS, T.C.; GONCALVES, J.A.C.; HARKONEN, J.; BUENO, C.C. Effects of radiation damage on dosimetric properties of standard float zone (FZ) and magnetic czochralski (MCz) diodes in high-dose electron processing applications. In: INTERNATIONAL CONFERENCE ON SOLID STATE DOSIMETRY, 17th, 22-27 de setembro, 2013, Recife, PE. <b>Abstract...</b> DisponÃvel em: http://repositorio.ipen.br/handle/123456789/20283.http://repositorio.ipen.br/handle/123456789/20283openAccessradiation effectsdosemetersmagnetic fieldsczochralski methodsilicon diodesradiation doseselectron beamsEffects of radiation damage on dosimetric properties of standard float zone (FZ) and magnetic czochralski (MCz) diodes in high-dose electron processing applicationsResumo de eventos cientÃficoshttps://orcid.org/0000-0001-7881-7254https://orcid.org/0000-0002-8940-9544