CORREA, A.A.S.BUENO, C.C.GONCALVES, J.A.C.SANTOS, M.D.S.2014-11-172014-11-182015-04-012014-11-172014-11-182015-04-01CORREA, A.A.S.; BUENO, C.C.; GONCALVES, J.A.C.; SANTOS, M.D.S. Deteccao e espectrometria de eletrons de conversao interna e particulas beta com diodos de Si. In: INTERNATIONAL NUCLEAR ATLANTIC CONFERENCE; NATIONAL MEETING ON NUCLEAR APPLICATIONS, 6th, Aug. 11-16, 2002, Rio de Janeiro, RJ. <b>Proceedings...</b> Disponível em: http://repositorio.ipen.br/handle/123456789/13454.http://repositorio.ipen.br/handle/123456789/13454openAccesselectron spectrometerssilicon diodesphotodiodessemiconductor detectorsbeta particlesDeteccao e espectrometria de eletrons de conversao interna e particulas beta com diodos de SiTexto completo de eventohttps://orcid.org/0000-0002-8940-9544https://orcid.org/0000-0001-7881-7254