CORDEIRO, MOACIR R.CARBONARI, ARTUR W.SAXENA, RAJENDRA N.MERCURIO, MARCIO E.PEREIRA, LUCIANO F.D.2014-11-172014-11-182015-04-022014-11-172014-11-182015-04-02CORDEIRO, MOACIR R.; CARBONARI, ARTUR W.; SAXENA, RAJENDRA N.; MERCURIO, MARCIO E.; PEREIRA, LUCIANO F.D. Defects in NTD silicon studied by evaporated and diluted sup(111)Cd probe nuclei by means of perturbed angular gamma-gamma correlation technique. In: INTERNATIONAL NUCLEAR ATLANTIC CONFERENCE; MEETING ON NUCLEAR APPLICATIONS, 8th/ MEETING ON REACTOR PHYSICS AND THERMAL HYDRAULICS, 15th, Sept. 30 - Oct. 5, 2007, Santos, SP. <b>Proceedings...</b> Disponível em: http://repositorio.ipen.br/handle/123456789/15730.http://repositorio.ipen.br/handle/123456789/15730openAccesssilicondoped materialsphosphorusdefectsneutron beamstransmutationperturbed angular correlationhyperfine structureDefects in NTD silicon studied by evaporated and diluted sup(111)Cd probe nuclei by means of perturbed angular gamma-gamma correlation techniqueTexto completo de eventohttps://orcid.org/0000-0002-4499-5949