FARIA, MARCELA E.M.LEITE, MARINA M.ICHIKAWA, RODRIGO U.VICHI, FLAVIO M.TURRILLAS, X.MARTINEZ, L.G.2020-12-112020-12-112020FARIA, MARCELA E.M.; LEITE, MARINA M.; ICHIKAWA, RODRIGO U.; VICHI, FLAVIO M.; TURRILLAS, X.; MARTINEZ, L.G. Thickness estimation of TiO2-based nanotubes using X-ray diffraction techniques. <b>Materials Science Forum</b>, v. 1012, p. 179-184, 2020. DOI: <a href="https://dx.doi.org/10.4028/www.scientific.net/MSF.1012.179">10.4028/www.scientific.net/MSF.1012.179</a>. Disponível em: http://200.136.52.105/handle/123456789/31644.0255-5476http://200.136.52.105/handle/123456789/31644TiO2-based nanotubes are a very promising material with many applications in solar cells, biomedical devices, gas sensors, hydrogen generation, supercapacitors, and lithium batteries, among others. Nanotube thickness is a very important property since it is related to electronic and surface mechanics. In this sense, transmission electron microscopy (TEM) can be used. However, it can be difficult to acquire a good TEM image because the transversal section of the nanotubes needs to be visible. In this work, TiO2-based nanotubes obtained via hydrothermal synthesis were studied using X-ray line profile analysis. Scherrer and Single-Line methods provided consistent results for the thickness of the nanotubes (≃ 5 nm) when compared with TEM. Additionally, Single-Line method was also applied to estimate the microstrain. The advantage of using XRD is given by the fact that it is a quick and statistically significant analysis when compared with TEM. The results show that XRD can be used as a rapid and reliable alternative for the thickness estimation of nanotubes.179-184closedAccessx-ray diffractiontitanium oxidesnanotubestransmission electron microscopyhydrothermal synthesisthicknessequationsArtigo de periódico101210.4028/www.scientific.net/MSF.1012.1790000-0001-7707-7821https://orcid.org/0000-0001-7707-7821Sem Percentil15.00