GONCALVES, JOSEMARY A.C.MANGIAROTTI, ALESSIOBUENO, CARMEN C.2022-08-122022-08-122022GONCALVES, JOSEMARY A.C.; MANGIAROTTI, ALESSIO; BUENO, CARMEN C. Characterization of a thin photodiode as a routine dosimeter for low-dose radiation processing applications. <b>Radiation Physics and Chemistry</b>, v. 198, p. 1-7, 2022. DOI: <a href="https://dx.doi.org/10.1016/j.radphyschem.2022.110200">10.1016/j.radphyschem.2022.110200</a>. Disponível em: http://repositorio.ipen.br/handle/123456789/33206.0969-806Xhttp://repositorio.ipen.br/handle/123456789/33206The characterization of a dosimetry system based on a commercial PIN photodiode as a routine dosimeter in a 60Co industrial facility is reported. The main parameters of the dose rate response (repeatability, reproducibility, and angular dependence) and the dose response (dependence on both dose rate and accumulated dose) are investigated. The results obtained, within a dose rate range of 3.7–52.8 Gy/h and doses up to 200 Gy, fully adhere to the standard protocols established for radiation processing dosimetry. The diode performance as a routine dosimeter is validated by the good overall agreement with radiochromic films and alanine dosimetry.1-7openAccessphotodiodesthin filmsgamma radiationdosimetrysilicon diodesArtigo de periódico19810.1016/j.radphyschem.2022.110200https://orcid.org/0000-0001-7881-7254https://orcid.org/0000-0002-8940-954465.874