RAELE, MARCUS P.PRETTO, LUCAS R. deFREITAS, ANDERSON Z. deFUJIMOTO, JAMES G.IZZATT, JOSEPH A.TUCHIN, VALERY V.2015-07-302015-07-30RAELE, MARCUS P.; PRETTO, LUCAS R. de; FREITAS, ANDERSON Z. de. Enhance resolution on OCT profilometry measurements using harmonic artifacts. In: FUJIMOTO, JAMES G. (ed.); IZZATT, JOSEPH A. (ed.); TUCHIN, VALERY V. (ed.). In: OPTICAL COHERENCE TOMOGRAPHY AND COHERENCE DOMAIN OPTICAL METHODS IN BIOMEDICINE, 19th, February 7, 2015, San Francisco, California, United States. <b>Proceedings...</b> p. 93123Q-1 - 93123Q-8. (SPIE Proceedings Series, 9312). Disponível em: http://repositorio.ipen.br/handle/123456789/23870.http://repositorio.ipen.br/handle/123456789/2387093123Q-1 - 93123Q-8openAccesscoherent radiationinterferometryharmonicsresolutionimagesfourier transformationtomographyoptical modelsTexto completo de eventohttps://orcid.org/0000-0002-5018-9126https://orcid.org/0000-0002-6461-6766