MORCELLI, A.E.MONTEIRO, W.A.MAIHARA, V.A.RODRIGUES, D.FERREIRA NETO, J.B.MONTAGNA, L.S.2014-11-192014-11-192015-04-012014-11-192014-11-192015-04-01MORCELLI, A.E.; MONTEIRO, W.A.; MAIHARA, V.A.; RODRIGUES, D.; FERREIRA NETO, J.B.; MONTAGNA, L.S. Chemical grade silicon - a study using the techniques of EDS, SEM and NAA. In: CONGRESS OF THE BRAZILIAN SOCIETY FOR MICROSCOPY AND MICROANALYSIS, 17th; CONGRESS OF THE BRAZILIAN SOCIETY FOR CELL BIOLOGY, 10th, Oct. 13-16, 1999, Santos, SP. <b>Proceedings...</b> p. 171-172. DisponÃvel em: http://repositorio.ipen.br/handle/123456789/21078.http://repositorio.ipen.br/handle/123456789/21078171-172openAccesssiliconchemical analysismicroanalysisx-ray spectroscopyscanning electron microscopyChemical grade silicon - a study using the techniques of EDS, SEM and NAAResumo de eventos cientÃficos