ICHIKAWA, RODRIGO U.YOSHITO, WALTER K.SAEKI, MARGARIDA J.MARANHAO, WILLIAN C.A.GOULART, FATIMAMARTINEZ, LUIS G.2018-02-192018-02-192017ICHIKAWA, RODRIGO U.; YOSHITO, WALTER K.; SAEKI, MARGARIDA J.; MARANHAO, WILLIAN C.A.; GOULART, FATIMA; MARTINEZ, LUIS G. Characterization of Mn0.67Zn0.33Fe2O4 nanoparticles synthesized under different pH. <b>Materials Science Forum</b>, v. 899, p. 48-53, 2017. DOI: <a href="https://dx.doi.org/10.4028/www.scientific.net/MSF.899.48">10.4028/www.scientific.net/MSF.899.48</a>. Disponível em: http://repositorio.ipen.br/handle/123456789/28493.1662-9752http://repositorio.ipen.br/handle/123456789/28493Nanostructured Mn-Zn ferrites were synthesized using co-precipitation in alkaline solution with different pH. The samples were characterized using X-ray diffraction (XRD), X-ray fluorescence (XRF), thermal analysis (TG-DTA), dynamic light scattering (DLS) and scanning electron microscopy (SEM) techniques. Monophasic nanoparticles were formed when synthesized with pH 10.5. This sample was heat-treated and its XRD data was refined by the Rietveld method. Mean crystallite sizes and microstrains were determined from X-ray line profile analysis using Single-Line and Warren-Averbach methods, which revealed a mean crystallite size of approximately 10 nm and negligible microstrains. Zn content was estimated using refined cell parameters, giving a value of 33 at %, in accordance with XRF result. TG-DTA revealed that the incorporation of α-Fe2O3 occurs around 1130 °C and 1200 °C with recrystallization of the Mn-Zn ferrite spinel phase. DLS showed that mean particle size increase with temperature up to 1159 nm at 800 °C. SEM analysis showed the samples agglomerate and present similar morphology with negligible size changing when calcined between 280 °C and 800 °C. However, the sample calcined at 1200 °C presents larger agglomerates due to the sintering process.48-53openAccessmanganese compoundszinc compoundsferritesnanoparticlesx-ray diffractionthermal gravimetric analysisdifferential thermal analysislight scatteringscanning electron microscopyArtigo de periódico89910.4028/www.scientific.net/MSF.899.48https://orcid.org/0000-0001-7707-7821Sem Percentil