SANTOS, ROBINSON A. dosSILVA, JULIO B.R. daMARTINS, JOAO F.T.FERRAZ, CAUE de M.COSTA, FABIO E. daGENNARI, ROSELI F.MESQUITA, CARLOS H. deHAMADA, MARGARIDA M.2014-11-172014-11-182015-04-022014-11-172014-11-182015-04-02SANTOS, ROBINSON A. dos; SILVA, JULIO B.R. da; MARTINS, JOAO F.T.; FERRAZ, CAUE de M.; COSTA, FABIO E. da; GENNARI, ROSELI F.; MESQUITA, CARLOS H. de; HAMADA, MARGARIDA M. Influence of impurities on the surface morphology of the TlBr crystal semiconductor. In: INTERNATIONAL NUCLEAR ATLANTIC CONFERENCE; MEETING ON NUCLEAR APPLICATIONS, 11th; MEETING ON REACTOR PHYSICS AND THERMAL HYDRAULICS, 18th; MEETING ON NUCLEAR INDUSTRY, 3rd, November 24-29, 2013, Recife, PE. <b>Proceedings...</b> DisponÃvel em: http://repositorio.ipen.br/handle/123456789/17312.http://repositorio.ipen.br/handle/123456789/17312openAccessbridgman methodcrystalsgamma radiationimpuritiesmorphologypurificationscanning electron microscopysemiconductor detectorsstoichiometrysurfacesthallium bromidesx-ray diffractionInfluence of impurities on the surface morphology of the TlBr crystal semiconductorTexto completo de evento