GONCALVES, JOSEMARY A.C.MANGIAROTTI, ALESSIOBUENO, CARMEN C.2019-11-272019-11-27GONCALVES, JOSEMARY A.C.; MANGIAROTTI, ALESSIO; BUENO, CARMEN C. Comparative evaluation of the performance of thin diodes used as on-line dosimeters in radiation processing applications. In: INTERNATIONAL NUCLEAR ATLANTIC CONFERENCE, October 21-25, 2019, Santos, SP. <b>Proceedings...</b> Rio de Janeiro: Associação Brasileira de Energia Nuclear, 2019. p. 192-197. Disponível em: http://repositorio.ipen.br/handle/123456789/30347.http://repositorio.ipen.br/handle/123456789/30347In this work, we report a comparison between the performance of two samples of commercial PIN photodiodes (SFH206K from OsramÒ and S2506-04 from HamamatsuÒ) mainly addressing the variation of their current sensitivities with accumulated dose ranging from 0-15 kGy. All the results so far obtained have revealed that the radiation induced currents are linearly dependent on dose rates from 3.65 to 55.64 Gy/h. The current sensitivity of both unirradiated diodes (0.178 nA.h/Gy.mm3) slightly decreases with accumulated dose, namely 0.32%/kGy (SFH206K) and 1.4%/kGy (S2506-04). Although the SFH206K device compares favorably with the S2506-04, both diodes can be considered as a low budge alternative, good enough for on-line dosimetry applications in the field of radiation processing.192-197openAccesscobalt 60comparative evaluationsdose ratesdosemeterselectrical faultsgamma radiationperformancephotodiodessensitivityTexto completo de eventohttps://orcid.org/0000-0001-7881-7254https://orcid.org/0000-0002-8940-9544