CAVALCANTE, F.H.M.GOMES, M.R.CARBONARI, A.W.PEREIRA, L.F.D.ROSSETTO, D.A.COSTA, M.S.ALVES, E.BARRADAS, N.P.FRANCO, N.REDONDO, L.M.LOPES, A.M.L.SOARES, J.C.2014-07-152014-07-302014-07-152014-07-302012CAVALCANTE, F.H.M.; GOMES, M.R.; CARBONARI, A.W.; PEREIRA, L.F.D.; ROSSETTO, D.A.; COSTA, M.S.; ALVES, E.; BARRADAS, N.P.; FRANCO, N.; REDONDO, L.M.; LOPES, A.M.L.; SOARES, J.C. Characterization of nanostructured HfOsub(2) films using RBS and PAC. <b>Nuclear Instruments and Methods in Physics Research, B</b>, v. 273, p. 195-198, 2012. DisponÃvel em: http://repositorio.ipen.br/handle/123456789/4301.0168-583Xhttp://repositorio.ipen.br/handle/123456789/4301195-198openAccesshyperfine structuretantalumnanostructureshafnium oxidesthin filmsdoped materialsironrutherford backscattering spectroscopyperturbed angular correlationCharacterization of nanostructured HfOsub(2) films using RBS and PACArtigo de periódico273https://orcid.org/0000-0002-4499-5949