SANTOS, THAIS C. dosGONCALVES, JOSEMARY A.C.PINTILIE, IOANABUENO, C.C.2014-11-172014-11-182015-04-012014-11-172014-11-182015-04-01SANTOS, THAIS C. dos; GONCALVES, JOSEMARY A.C.; PINTILIE, IOANA; BUENO, C.C. Short-term repeatability of a rad-hard EPI diode applied in electron processing dosimetry. In: IEEE NUCLEAR SCIENCE SYMPOSIUM CONFERENCE RECORD; MEDICAL IMAGING CONFERENCE, October 23-29, 2011, Valencia, Espanha. <b>Proceedings...</b> p. 233-236. DOI: <a href="https://dx.doi.org/10.1109/NSSMIC.2011.6154486">10.1109/NSSMIC.2011.6154486</a>. Disponível em: http://repositorio.ipen.br/handle/123456789/18049.http://repositorio.ipen.br/handle/123456789/18049233-236openAccesssemiconductor diodesepitaxysi semiconductor detectorselectron dosimetryirradiationTexto completo de evento10.1109/NSSMIC.2011.6154486https://orcid.org/0000-0001-7881-7254https://orcid.org/0000-0002-8940-9544