BARCHETTA, NAYARANANNI, LARISSAMIRANDA, JEANLAZAR, DOLORESASSUI, VALTERSAAVEDRA, GUILHERME2018-02-222018-02-222017BARCHETTA, NAYARA; NANNI, LARISSA; MIRANDA, JEAN; LAZAR, DOLORES; ASSUI, VALTER; SAAVEDRA, GUILHERME. Surface roughness and volumetric contraction of a Y-TZP ceramic sintered by microwave energy and by resistive heating. <b>Brazilian Dental Science</b>, v. 20, n. 04, p. 124-129, 2017. DOI: <a href="https://dx.doi.org/10.14295/bds.2017.v20i4.1481">10.14295/bds.2017.v20i4.1481</a>. Disponível em: http://repositorio.ipen.br/handle/123456789/28538.2178-6011http://repositorio.ipen.br/handle/123456789/28538Objectives: The aim of this study was to evaluate a Y-TZP ceramic sintered by a microwave protocol on volume shrinkage and surface roughness. Material and Methods: Twenty four (N=24) Y-TZP discs were fabricated by milling in CAD/ CAM for size standardization. The mean final dimensions of the specimens were 15 mm X 1.6 mm. Samples were divided into 2 groups (n=12): conventional resistive heating sintering protocol (C - Control) and microwave sintering protocol (MO - experimental). For the characterization of the specimens, surface roughness (Ra and Rz parameters) was evaluated with a roughness tester, and volume shrinkage was measured with a hand micrometer. Data were statistically evaluated by Student’s t and Mann-Whitney U tests (α=0.05). Results: The roughness results were: 0.25 μm ± 0.02 (Ra) and 2.68 μm ± 0.666 (Rz) for the MO samples; 0.26 μm ± 0.04 (Ra) and 2.73 μm ± 0.461 (Rz) for the C group (Ra: p = 0.19; Rz: p = 0.81). The shrinkage results was: MO (21.02% ± 2.70) and C (20.10% ± 0.52) (p = 0.274). Conclusion: The conventional and microwave sintering methods were similar regarding surface roughness and volume shrinkage of Y-TZP dental ceramic.124-129openAccessceramicssinteringmicrowave radiationzirconiumsurfacesroughnessSurface roughness and volumetric contraction of a Y-TZP ceramic sintered by microwave energy and by resistive heatingArtigo de periódico042010.14295/bds.2017.v20i4.1481https://orcid.org/0000-0001-7384-304XSem Percentil