VIANA, RODRIGO S.GALARRETA-VALVERDE, MIGUEL A.MEKKAOUI, CHOUKRIYORIYAZ, HELIOJACKOWSKI, MARCEL P.HOESCHEN, CHRISTOPHKONTOS, DESPINA2016-03-112016-03-11VIANA, RODRIGO S.; GALARRETA-VALVERDE, MIGUEL A.; MEKKAOUI, CHOUKRI; YORIYAZ, HELIO; JACKOWSKI, MARCEL P. NSECT sinogram sampling optimization by normalized mutual information. In: HOESCHEN, CHRISTOPH (ed.); KONTOS, DESPINA (ed.). In: MEDICAL IMAGING 2015: PHYSICS OF MEDICAL IMAGING, April 28, 2015, Orlando, Florida, USA. <b>Proceedings...</b> p. 94122B1-1 - 94122B1-6. (SPIE Proceedings Series, 9412). DisponÃvel em: http://repositorio.ipen.br/handle/123456789/25837.http://repositorio.ipen.br/handle/123456789/2583794122B1-1 - 94122B1-6openAccesscomputerized tomographyimagesmonte carlo methodoptimizationstimulated emissionsamplinginformationcomparative evaluationsNSECT sinogram sampling optimization by normalized mutual informationTexto completo de eventohttps://orcid.org/0000-0003-4023-236X