ICHIKAWA, RODRIGO U.MARTINEZ, LUIS G.PEREIRA, LUIZ A.T.IMAKUMA, KENGOTURRILLAS, XABIER2016-06-232016-06-23ICHIKAWA, RODRIGO U.; MARTINEZ, LUIS G.; PEREIRA, LUIZ A.T.; IMAKUMA, KENGO; TURRILLAS, XABIER. Study of the microstructure in remelted zircaloy by synchrotron diffraction line profile analysis. In: REUNIÃO ANUAL DE USUÁRIOS DO LNLS, 24., 11-14 de março, 2014, Campinas, SP. <b>Abstract...</b> p. 61. Disponível em: http://repositorio.ipen.br/handle/123456789/26423.http://repositorio.ipen.br/handle/123456789/2642361openAccesszircaloyx-ray diffractionsizemicrostructuresynchrotron radiationstrainsheatyttrium oxidesResumo de eventos científicoshttps://orcid.org/0000-0001-7707-7821