AMARAL, MARCELLO M.RAELE, MARCUS P.CALY, JOSE P.SAMAD, RICARDO E.VIEIRA JUNIOR, NILSON D.FREITAS, ANDERSON Z.2014-11-172014-11-182015-04-022014-11-172014-11-182015-04-02AMARAL, MARCELLO M.; RAELE, MARCUS P.; CALY, JOSE P.; SAMAD, RICARDO E.; VIEIRA JUNIOR, NILSON D.; FREITAS, ANDERSON Z. Roughness measurement methodology according to DIN 4768 using optical coherence tomography (OCT). In: SPIE EUROPE: OPTICAL METROLOGY, 14-18 June, 2009, Munique, Alemanha. <b>Proceedings...</b> (SPIE Proceedings Series, 7390). DisponÃvel em: http://repositorio.ipen.br/handle/123456789/16657.http://repositorio.ipen.br/handle/123456789/16657openAccessoptical propertiestomographyroughnesssurface propertiesstandardsRoughness measurement methodology according to DIN 4768 using optical coherence tomography (OCT)Texto completo de eventohttps://orcid.org/0000-0002-5018-9126https://orcid.org/0000-0003-0092-9357https://orcid.org/0000-0001-7762-8961https://orcid.org/0000-0002-6461-6766