COURROL, L.C.GOMES, L.RANIERI, I.M.2014-07-302014-07-302014-07-302014-07-301999COURROL, L.C.; GOMES, L.; RANIERI, I.M. Evaluation of microscopic parameters for ETU process in diode-pumped Nd:YLF. <b>Radiation Effects and Defects in Solids</b>, v. 149, p. 369-374, 1999. DisponÃvel em: http://repositorio.ipen.br/handle/123456789/6280.1042-0150http://repositorio.ipen.br/handle/123456789/6280369-374openAccesslasersneodymium laserslithium fluoridesyttrium fluoridesdiode-pumped solid state laserslaser spectroscopyexcitationEvaluation of microscopic parameters for ETU process in diode-pumped Nd:YLFArtigo de periódico149