MENDES, R.G.BACICHETTI, A.L.MIR, M.LIMA, N.B.MASCARENHAS, Y.P.EIRAS, J.A.2016-09-222016-09-222006MENDES, R.G.; BACICHETTI, A.L.; MIR, M.; LIMA, N.B.; MASCARENHAS, Y.P.; EIRAS, J.A. Structural, dielectric and ferroelectric properties of mixed texture PbZr0.20Ti0.80O3 thin films prepared by a chemical method. <b>Ferroelectrics</b>, v. 335, p. 249-255, 2006. DisponÃvel em: http://repositorio.ipen.br/handle/123456789/26700.0015-0193http://repositorio.ipen.br/handle/123456789/26700249-255openAccessdielectric propertiestexturepztthin filmstexturedielectric materialsferroelectric materialschemical preparationStructural, dielectric and ferroelectric properties of mixed texture PbZr0.20Ti0.80O3 thin films prepared by a chemical methodArtigo de periódico335https://orcid.org/0000-0002-6444-9224