PASCHOLATI, P.R.RIZZUTTO, M.A.BARBOSA, M.D.L.ALBUQUERQUE, C.NEVES, G.2014-11-172014-11-182015-04-022014-11-172014-11-182015-04-02PASCHOLATI, P.R.; RIZZUTTO, M.A.; BARBOSA, M.D.L.; ALBUQUERQUE, C.; NEVES, G. External beam pixe analysis analysis of painting. In: INTERNATIONAL NUCLEAR ATLANTIC CONFERENCE; ENCONTRO NACIONAL DE APLICACOES NUCLEARES, 7th, ago. 28 - set. 2, 2005, Santos, SP. <b>Anais...</b> DisponÃvel em: http://repositorio.ipen.br/handle/123456789/18165.http://repositorio.ipen.br/handle/123456789/18165openAccessarchaeological specimenscultural objectsexperimental datamulti-element analysispixe analysissi semiconductor detectorstrace amountsExternal beam pixe analysis analysis of paintingTexto completo de evento