Estimation of mean crystallite sizes of XRD standard reference materials produced at IPEN by XLPA

MARTINEZ, LUIS G.ICHIKAWA, RODRIGO U.IMAKUMA, KENGOTURRILLAS, XABIERORLANDO, MARCOS T.D.2015-03-172015-04-012015-03-172015-04-01MARTINEZ, LUIS G.; ICHIKAWA, RODRIGO U.; IMAKUMA, KENGO; TURRILLAS, XABIER; ORLANDO, MARCOS T.D. Estimation of mean crystallite sizes of XRD standard reference materials produced at IPEN by XLPA. In: REUNIÃO ANUAL DE USUÁRIOS DO LABORATORIO NACIONAL DE LUZ SINCROTRON, 24., 11-12 de março, 2014, Campinas, SP. <b>Abstract...</b> p. 58. Disponível em: http://repositorio.ipen.br/handle/123456789/23604.http://repositorio.ipen.br/handle/123456789/2360458openAccessmaterialscalibration standardsdiffractometersgrain sizemicrostructurex-ray diffractionEstimation of mean crystallite sizes of XRD standard reference materials produced at IPEN by XLPAResumo de eventos científicoshttps://orcid.org/0000-0001-7707-7821