BUENO, C.C.GONCALVES, J.A.C.PASCHOLATI, P.R.PEIXOTO, T.P.VANIN, V.R.2014-11-172014-11-182015-04-012014-11-172014-11-182015-04-01BUENO, C.C.; GONCALVES, J.A.C.; PASCHOLATI, P.R.; PEIXOTO, T.P.; VANIN, V.R. Time decay costants of resistive detectors. In: INTERNATIONAL CONFERENCE ON NUCLEAR DATA FOR SCIENCE AND TECHNOLOGY, Sept. 26 - Oct. 1, 2004, Santa Fe, New Mexico. <b>Proceedings...</b> DisponÃvel em: http://repositorio.ipen.br/handle/123456789/17518.http://repositorio.ipen.br/handle/123456789/17518openAccessamplitudescounting ratescylindrical configurationdielectric materialsefficiencygaingeometrynuclear decaypulsesrelaxationtransientsTime decay costants of resistive detectorsTexto completo de eventohttps://orcid.org/0000-0002-8940-9544https://orcid.org/0000-0001-7881-7254