SAMAD, R.E.VIEIRA JUNIOR, N.D.2014-07-302014-07-302014-07-302014-07-301998SAMAD, R.E.; VIEIRA JUNIOR, N.D. Analytical description of z-scan on-axis intensity based on the Huygens-Fresnel principle. <b>Journal of the Optical Society of America, B</b>, v. 15, n. 11, p. 2742-2747, 1998. DisponÃvel em: http://repositorio.ipen.br/handle/123456789/6342.0740-3224http://repositorio.ipen.br/handle/123456789/63422742-2747openAccessnonlinear opticslaserselectric fieldshuygens principleanalytical solutiongaussian processesrefractive indexAnalytical description of z-scan on-axis intensity based on the Huygens-Fresnel principleArtigo de periódico1115https://orcid.org/0000-0003-0092-9357https://orcid.org/0000-0001-7762-8961