NOGUEIRA, M.S.MOTA, H.C.CAMPOS, L.L.2014-11-172014-11-182015-04-012014-11-172014-11-182015-04-01NOGUEIRA, M.S.; MOTA, H.C.; CAMPOS, L.L. (HP)Ge measurement of spectra for diagnostic X-ray beams. In: INTERNATIONAL MEERING ON APPLIED PHYSICS 2003, 1st, Oct. 14-18, 2003, Badajoz, Spain. <b>Proceedings...</b> DisponÃvel em: http://repositorio.ipen.br/handle/123456789/15413.http://repositorio.ipen.br/handle/123456789/15413closedAccessx-ray spectraradiologydiagnosisenergy rangehigh-purity ge detectorsmulti-channel analyzersfiltrationaluminiumleadmonitoring(HP)Ge measurement of spectra for diagnostic X-ray beamsTexto completo de eventohttps://orcid.org/0000-0001-7137-0613