MIYAKAWA, W.PIZZO, A.M.SALVADORI, M.C.B.S.RODRIGUES, N.A.S.DAMIAO, A.ZEZELL, D.M.2014-07-312014-07-312014-07-312014-07-312001MIYAKAWA, W.; PIZZO, A.M.; SALVADORI, M.C.B.S.; RODRIGUES, N.A.S.; DAMIAO, A.; ZEZELL, D.M. Pilot study on atomic force microscopy of COsub(2)-TEA laser-irradiated enamel surfaces. <b>Journal of Oral Laser Applications</b>, v. 1, n. 3, p. 181-187, 2001. DisponÃvel em: http://repositorio.ipen.br/handle/123456789/7262.1473-7809http://repositorio.ipen.br/handle/123456789/7262181-187closedAccesslaserscarbon dioxide lasersenamelsroughnessatomic force microscopyteethmancattledentistryPilot study on atomic force microscopy of COsub(2)-TEA laser-irradiated enamel surfacesArtigo de periódico31https://orcid.org/0000-0001-7404-9606