CAMARGO, F.BUENO, C.C.GONCALVES, J.A.C.SANTOS, M.D.S.2014-11-172014-11-182015-04-012014-11-172014-11-182015-04-01CAMARGO, F.; BUENO, C.C.; GONCALVES, J.A.C.; SANTOS, M.D.S. Utilizacao de diodos de Si para espectrometria alfa. In: INTERNATIONAL NUCLEAR ATLANTIC CONFERENCE; NATIONAL MEETING ON NUCLEAR APPLICATIONS, 6th, Aug. 11-16, 2002, Rio de Janeiro, RJ. <b>Proceedings...</b> Disponível em: http://repositorio.ipen.br/handle/123456789/13453.http://repositorio.ipen.br/handle/123456789/13453openAccesssilicon diodesphotodiodesalpha spectroscopysemiconductor detectorsTexto completo de eventohttps://orcid.org/0000-0002-8940-9544https://orcid.org/0000-0001-7881-7254