RODRIGUES, V.A.MONTEIRO, W.A.SALIBA SILVA, A.M.FERREIRA, N.A.M.SILVA, L.C.E.CALDERON BENAVIDES, H.A.YACAMAN, M.J.2014-11-192014-11-192015-04-012014-11-192014-11-192015-04-01RODRIGUES, V.A.; MONTEIRO, W.A.; SALIBA SILVA, A.M.; FERREIRA, N.A.M.; SILVA, L.C.E. Transmission electron microscopy in the microstructure study of electrical steel Fe-3 percent Si. In: CALDERON BENAVIDES, H.A. (ed.); YACAMAN, M.J. (ed.). In: INTERNATIONAL CONGRESS ON ELECTRON MICROSCOPY, 14th, Aug. 31 - Sept. 4, 1998, Cancun, Mexico. <b>Proceedings...</b> p. 235-236. DisponÃvel em: http://repositorio.ipen.br/handle/123456789/21812.http://repositorio.ipen.br/handle/123456789/21812235-236openAccesssteelsiron alloyssilicon alloystransmission electron microscopymicrostructuremanganese sulfidesprecipitationTransmission electron microscopy in the microstructure study of electrical steel Fe-3 percent SiResumo de eventos cientÃficos