SANTOS, ROBERTO M. dosGENEZINI, FREDERICO A.ZAHN, GUILHERME S.VANIN, VITO R.2014-11-172014-11-182015-04-022014-11-172014-11-182015-04-02SANTOS, ROBERTO M. dos; GENEZINI, FREDERICO A.; ZAHN, GUILHERME S. Detector efficiency calibration for extended gamma-ray sources. In: VANIN, VITO R. (ed.). In: BRAZILIAN WORKSHOP ON NUCLEAR PHYSICS, 33rd, September 7-11, 2010, Campos do Jordão, SP. <b>Proceedings...</b> p. 220-230. DOI: <a href="https://dx.doi.org/10.1063/1.3608961">10.1063/1.3608961</a>. Disponível em: http://repositorio.ipen.br/handle/123456789/17881.http://repositorio.ipen.br/handle/123456789/17881A new method for the efficiency calibration of Ge detectors efficiency in measurements with large sources is proposed. To check the reliability of the method, a standard large source was produced and the results are compared to the ones obtained using the proposed method. The preliminary results point to the needs of increasing statistical measurements to allow for a more accurate evaluation of the method.220-230openAccesscalibrationcalibration standardsefficiencygamma detectionge semiconductor detectorsmonte carlo methodTexto completo de evento10.1063/1.3608961https://orcid.org/0000-0003-3237-8588https://orcid.org/0000-0002-6318-6805