SANTOS, EDSON M.ORLANDO, MARCOS T.D.MILTAO, MILTON S.R.MARTINEZ, LUIS G.ALVES, ALVARO S.PASSOS, CARLOS A.2014-07-312014-07-312014-07-312014-07-312010SANTOS, EDSON M.; ORLANDO, MARCOS T.D.; MILTAO, MILTON S.R.; MARTINEZ, LUIS G.; ALVES, ALVARO S.; PASSOS, CARLOS A. Model for analysis of biaxial and triaxial stresses by X-ray diffraction assuming orthotropic materials. <b>Japanese Journal of Applied Physics</b>, v. 49, n. 5, p. 056601-1 - 056601-9, 2010. DisponÃvel em: http://repositorio.ipen.br/handle/123456789/8125.0021-4922http://repositorio.ipen.br/handle/123456789/8125056601-1 - 056601-9closedAccessanisotropycalculation methodsdeformationhooke lawmathematical modelspoisson ratiopolycrystalsresidual stressesshear propertiesstrainsstress analysisx-ray diffractionyoung modulusModel for analysis of biaxial and triaxial stresses by X-ray diffraction assuming orthotropic materialsArtigo de periódico549https://orcid.org/0000-0001-7707-7821