SAMAD, RICARDO E.BALDOCHI, SONIA L.VIEIRA JUNIOR, NILSON D.2014-07-152014-07-302014-07-152014-07-302008SAMAD, RICARDO E.; BALDOCHI, SONIA L.; VIEIRA JUNIOR, NILSON D. Diagonal scan measurement of Cr:LiSAF 20 ps ablation threshold. <b>Applied Optics</b>, v. 47, n. 7, p. 920-924, 2008. DisponÃvel em: http://repositorio.ipen.br/handle/123456789/5095.1559-128Xhttp://repositorio.ipen.br/handle/123456789/5095920-924openAccessaluminium compoundschromium ionsfluorideslithium compoundsthreshold energylaser radiationpulsesmeasure theoryDiagonal scan measurement of Cr:LiSAF 20 ps ablation thresholdArtigo de periódico747https://orcid.org/0000-0003-0092-9357https://orcid.org/0000-0001-7762-8961